GATE EE 2020 Set 1 — Question 35

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NAT+1 / -0HardElectric Flux & Gauss's LawElectrostaticsElectromagnetic Fields

Electromagnetic Fields → Electrostatics → Electric Flux & Gauss's Law

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Question

The cross-section of a metal-oxide-semiconductor structure is shown schematically. Starting from an uncharged condition, a bias of +3 V+3\text{ V} is applied to the gate contact with respect to the body contact. The charge inside the silicon dioxide layer is then measured to be +Q+Q. The total charge contained within the dashed box shown, upon application of bias, expressed as a multiple of QQ (absolute value in Coulombs, rounded off to the nearest integer) is ______.
Schematic of a MOS structure with a dashed box enclosing the gate, oxide, and silicon layers
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