GATE EC 2016 Set 1 — Question 49

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MCQ+2 / -0.67MediumGeneration & RecombinationCarrier TransportElectronic Devices

Electronic Devices → Carrier Transport → Generation & Recombination

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Consider a silicon sample at T=300 KT = 300 \text{ K}, with a uniform donor density Nd=5×1016 cm3N_d = 5 \times 10^{16} \text{ cm}^{-3}, illuminated uniformly such that the optical generation rate is Gopt=1.5×1020 cm3s1G_{opt}=1.5\times10^{20} \text{ cm}^{-3}\text{s}^{-1} throughout the sample. The incident radiation is turned off at t=0t = 0. Assume low-level injection to be valid and ignore surface effects. The carrier lifetimes are τp0=0.1μs\tau_{p0}= 0.1 \mu\text{s} and τn0=0.5μs\tau_{n0} = 0.5 \mu\text{s}.
n-type Si semiconductor

The hole concentration at t=0t = 0 and the hole concentration at t=0.3μst = 0.3 \mu\text{s}, respectively, are
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