GATE EE 2020 Set 1 — Question 62
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Analog & Digital Electronics → Diode Circuits → Error Analysis
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Question
A non-ideal Si-based pn junction diode is tested by sweeping the bias applied across its terminals from to . The effective thermal voltage, , for the diode is measured to be . The resolution of the voltage source in the measurement range is . The percentage uncertainty (rounded off to 2 decimal places) in the measured current at a bias voltage of is ______.
Correct answer
11.5 to 12
Solution
The diode current is given by .
For a non-ideal diode where is the effective thermal voltage, the uncertainty in current due to uncertainties in and is found by differentiating:
Dividing by :
Given , , , and .
Let .
The relative uncertainty is
.
Percentage uncertainty .
For a non-ideal diode where is the effective thermal voltage, the uncertainty in current due to uncertainties in and is found by differentiating:
Dividing by :
Given , , , and .
Let .
The relative uncertainty is
.
Percentage uncertainty .
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